Introduction to Business Operation

Enviromental test

A large variety of discrete electronic devices are used in rockets、satellite and ISS equipments and their performance has become highly functional these years. Under these circumstances, HIREC conducts various tests to evaluate the environmental resistance of electronic devices as may be required by customers.

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Temperature Cycling Test

At HIREC, we conduct temperature cycling test in conformity with MIL-STD-883 Method 1010 to verify the resistance properties of electronic parts against the high and low temperature cycles in the space environment.

  • Testing device:
    TSV-40 manufactured by TABAIESPEC

  • Temperature range:
    High temperature exposure from +60 to 200℃
    Low temperature exposure from -65 to -10℃

  • Testing conditions (example):
    MIL-STD-883 Condition 1010,
    Condition C -65 to +150℃ for 100 cycles

Temperature Cycling Test
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High Temperature & Humidity Test

Plastic packages of resin sealed parts as represented by commercial parts are prone to water absorption. Consequently, it is likely that the corrosion of aluminum metallization on the semiconductor chips cause failure that may affect reliability of the parts. The following are HIREC's test items to various levels of humidity:

- Moisture Resistance Test -

A test to evaluate resistance against degradation under a high temperature and humidity condition. At HIREC, we conduct moisture resistance test in conformance with MIL-STD-883 method 1004 as part of quality conformance inspection Group D test after the manufacturing/screening test.

  • Testing condition: +25 to 65℃ , RH 80 to 100%

- High Temperature & Humidity Bias Test -

An assessment test of electronic devices is conducted with applying bias voltage in nonoperational condition under a high temperature and humidity environment.

Typical testing condition is 80, 85% RH with rated voltage. HIREC conducts tests on various types of parts by dividing them into the flight parts and the commercial parts in general.

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Electro Static Discharge Test

Electro Static Discharge Test

Electrostatic charge is generated around us due to various causes. If it happened to be applied to semiconductor devices, even a small amount of electrostatic discharge (ESD) may cause fatal failures in them.

For devices used for space applications, which require high reliability, frequent inspections are implemented through the manufacturing process.

Since electrostatic charge applied by a worker may cause damage in semiconductor devices, we conduct a withstand voltage test, ESD (electrostatic Discharge) test on semiconductor parts for space applications.

At HIREC, we have been making assessment of electrostatic resistance of space electronic devices for NASDA by installing test equipment that enables to conduct a 4,000 V, 128 pin test in conformance with MIL and EIAJ standards.

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