Introduction to Business Operation

Radiation test

With the assistance of related institutions, HIREC conducts a total ionization dose (TID) test with gamma-ray radiation, single event effect (SEE) test using a high-energy ion accelerator, and a proton radiation test in order to evaluate the radiation hardness of electronic devices.

HIREC provides services such as implementation of radiation tests and technical support for the tests in cases that customers conduct radiation tests by themselves.

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Total Irradiation Dose (TID) Test

At HIREC, we conduct conventional high dose-rate total ionization dose testing at approx.

103 to 104 Gy(Si)/hr and low dose-rate testing at approx. 0.1 to 1 Gy(Si)/hr to evaluate radiation hardness of electronic devices using Co-60 gamma-ray facility at the Japan Atomic Energy Research Institute(JAERI ).

Low dose-rate testing is effective to evaluate commercial or low radiation hardness devices.

We have been accumulating test data as well as testing and analysis technique.

Co-60 Gamma-ray TID test at JAERI/Takasaki
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Single Event Effect (SEE) Test

SEE test such as SE Latch-up, SE Upset, SE Transient, SE Burn-out, etc. are conducted using high-energy ion accelerator at the Japan Atomic Energy Research Institute (JAERI/Takasaki), the Brookhaven National Laboratory(BNL) in USA, and the Lawrence Berkeley National Laboratory(LBNL) in USA.

Californium 252 fission fragments are also available at JAXA/TKSC for preliminary SEE testing.

We release the information concerning irradiation test at JAERI/Takasaki three times a year and guide the information of BNL any time.

  • Evaluation Items
    • LET -SEU cross section
    • SEU LETTH Threshold
    • SEU Saturated cross section
    • SEL LETTH Threshold
Californium 252 source set up at JAXA SEE test with heavy ions at TIARA
Californium 252 source set up at JAXA SEE test with heavy ions at TIARA
TVDG(Tandem Van de Graaff) Accelerator TIARA facility at JAERI/Takasaki
TVDG(Tandem Van de Graaff) Accelerator TIARA facility at JAERI/Takasaki
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Soft Error Rate (SER) and Other Radiation Test

Soft errors are nondestructive functional errors induced by particle strikes. Irradiation test using from 20 to 200MeV proton can simulate these soft errors caused by neutrons at ground level.

Displacement damage is the main degradation mechanism for optical devices and solar cells.

HIREC conducts proton and electron radiation tests at the Japan Atomic Energy Research Institute (JAERI), at National Institute of Radiological Sciences (NIRS) in JAPAN and at the Crocker Nucleon Laboratory (CNL) at UC. Devices in USA.

  • Evaluation Items(Proton SEE test)
    • Energy -SEU cross section
    • Bendell parameters
TIARA facility at JAERI/Takasaki
  • Abbreviation:
  • SEU : Single Event Upset
  • SEL : Single Event Latch up
  • SEB : Single Event Burn out
  • LET : Linear Energy Transfer
  • SET :Single Event Transient
  • SEGR: Single Event Gate Rupture

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