論文・特許

発表論文

題名 (著者/年) 掲載誌・会議名等
地表に降る宇宙線起因中性子が起こすハードエラー
(H. Asai/2014〜)
JEITA半導体信頼性技術小委員会 半導体デバイス信頼性セミナー
宇宙線起因中性子によるSiCパワーMOSFETのシングルイベントバーンアウト評価
(H. Asai/2014)
先進パワー半導体分科会 第1回講演会
SiC MOSFETに対する宇宙線起因地表中性子によるSEB耐性評価
(H. Asai/2014)
ソフトエラー勉強会2014
Tolerance against Terrestrial Neutron-Induced Single-Event Burnout in SiC MOSFETs
(H. Asai/2014)
NSREC2014 「IEEE Nuclear Science Radiation Effects Conference」
宇宙線起因中性子によるSiC-MOSFETのハードエラーについて
(H. Asai/2013)
SiC及び関連半導体研究 第22回講演会
Evaluation of SiC Power Diodes against Terrestrial Neutron-Induced Failure at Ground Level
(H. Asai/2012)
RASEDA_2012 「The 10th International Workshop on Radiation Effects on Semiconductor Devices for Space Application 」
Terrestrial Neutron-Induced Single-Event Burnout in SiC Power Diodes
(H. Asai/2011)
RADECS2011
宇宙線起因地表中性子によるSiCパワーダイオードのシングルイベントバーンアウト
(H. Asai/2011)
SiC及び関連ワイドギャップ半導体研究会 第20回講演会
”Radiation Hardness-By-Design SRAM Design for 0.15um Fully Depleted SOI-ASIC”
(A. Makihara/2011)
RADECS2011
高エネルギー中性子によるSiC及びSiパワー素子の故障評価
(H. Asai/2010)
SiC及び関連ワイドギャップ半導体研究会 第19回講演会
Flux Verification of High Intensity Spallation Neutron Beam for SEE Testing
(K. Sugimoto/2010)
RASEDA_2010 「The 9th International Workshop on Radiation Effects on Semiconductor Devices for Space Application 」
Evaluation of High Energy Neutron-Induced Single Event Burnout in High Voltage Power Devices
(H. Asai/2010)
RASEDA_2010 「The 9th International Workshop on Radiation Effects on Semiconductor Devices for Space Application」
Radiation Hardness-By-Design Library for a 0.15-mm Fully Depleted SOI-ASIC
(A. Makihara/2010)
RASEDA_2010 「The 9th International Workshop on Radiation Effects on Semiconductor Devices for Space Application」
”Improved Radiation Hardness-By-Design Library for a 0.15um Fully Depleted SOI-AISC”
(A. Makihara/2010)
RADECS2010
衛星設計標準の制定に向けた宇宙用絶縁材料の絶縁破壊試験(第4報)
(H.Hayashi/2009)
第53回宇宙科学技術連合講演会(2009)
”Total Ionizing Dose and Single Event Effects Test Results of a Radiation Hardness-By-Design Library for 0.15um Fully Depleted SOI-AISC”
(A. Makihara/2009)
RADECS2009
宇宙線起因中性子が引き起こす半導体デバイスの故障について
(K.Sugimoto/2010)
第1回 半導体材料・デバイスフォーラム
SiCパワーダイオードの高エネルギー白色中性子照射効果
(H.Asai/2010)
2010年春季 第57回 応用物理学関係連合講演会
SiCパワーダイオードの白色中性子照射効果
(H.Asai/2009)
SiC及び関連ワイドギャップ半導体研究会 第18回講演会
“The development of a new transportable proton recoil detector for neutron SER testing”
(H.Asai/2008)
RASEDA_2008 「The 9th International Workshop on Radiation Effects on Semiconductor Devices for Space Application」
“New SET Characterization Technique using SPICE for Fully Depleted CMOS/SOI Digital Circuit”
(A. Makihara/2008)
RASEDA_2008 「The 9th International Workshop on Radiation Effects on Semiconductor Devices for Space Application」
The development of a transportable neutron detector for SER testing
(H.Asai)
8th European Workshop on Radiation Effects on Components and Systems
「衛星設計標準の制定に向けた宇宙用絶縁材料の絶縁破壊試験(第3報)」
(H.Hayashi/2008)
第52回 宇宙科学技術連合講演会
New SET Characterization Technique Utilizing SPICE for Fully Depleted CMOS/SOI Digital Circuitries
(A. Makihara/2008)
NSREC2008(International Nuclear & Space Radiation Effects Conference)
可搬型反跳陽子テレスコープの開発
(H.Asai/2008)
2008年春季 第55回応用物理学関係連合講演会
Optimization for SEU/SET Immunity on 0.15μm Fully Depleted CMOSS/SOI Digital Logic Devices.(A. Makihara/2006) RASEDA_2006 「The 7th International Workshop on Radiation Effects on Semiconductor Devices for Space Application」
Optimization for SEU/SET Immunity on 0.15μm Fully Depleted CMOSS/SOI Digital Logic Devices.(A. Makihara/2006) NSREC_2006 (International Nuclear & Space Radiation Effects Conference)
Hardness-by-Design Approach for 0.15μm Fully Depleted CMOS/SOI Digital Logic Devices with Enhanced SEU/SET immunity(A. Makihara/2005) NSREC_2005 (International Nuclear & Space Radiation Effects Conference)
Effective Post-Programming Screening of anti-fuse FPGAs for Space Applications(Y. Sakaide/2004) 7th Militaly and Aerospace Programmable logic Devices(MAPLD) International Conference
Single-Event Effects in 0.15μm Fully-Depleted CMOS/SOI Commercial Process(A. Makihara/2004) NSREC_2004(International Nuclear & Space Radiation Effects Conference)
Influence of Gamma-ray Irradiation on SEU Sensitivity of Latest Commercial SRAMs( K. Sugimoto/2004) #14 Single Event Effects Symposium
プロトンSEUと重イオンSEUの相関性( I. Nashiyama/2004) 第4回半導体の照射効果研究会予稿集
Single-Event Effects in 0.18 um CMOS Commercial Processes(A. Makihara/2003) NSREC_2003(International Nuclear & Space Radiation Effects Conference)
Correlation Between Proton and Heavy-Ion SEUs in Commercial Memory Devices(K. Chiba/2003) 2002 IEEE Radiation Effects Data Workshop
Development of 200MIPS-class 64bit MPU for Space Application(K. Sugimoto/2003) 第4回日仏宇宙協力シンポジウム
A Comprehensive SEU Test Method for Microprocessors( K. Chiba/2002) 第46回宇宙科学技術連合講演会講演集
Proton Irradiation Testing of Commercial Semiconductor Memories for the MDS-1 Project( K. Chiba/2002) The 5th International Workshop on Radiation Effects on Semiconductor Devices for Space Application
Use of Commercial Device Technologies for Space Applications( M. Urano/2002) The 5th International Workshop on Radiation Effects on Semiconductor Devices for Space Application
Development of 16bitMPU for Space Application(A. Makihara/ 2002) ISTS #23
Development of 1M Gate CMOS Gate Array(M. Urano/2002) ISTS #23
Introduction of 64bit MPU for Space Application( K. Sugimoto/2002) EIA G-12 meeting
放射線照射試験方法 ---照射設備利用の盲点---(I. Nashiyama/2001) 第1回半導体の照射効果研究会予稿集
A Comprehensive SEU Test Method for Microprocessors(K. Chiba/2000) Proceedings of The 4th International Workshop on Radiation Effects on Semiconductor Devices for Space Application
Radiation Tolerance of Commercial Low-Voltage Buffer and Flip-Flop Devices(T. Ishikiri/2000) Proceedings of The 4th International Workshop on Radiation Effects on Semiconductor Devices for Space Application
MDS-1 Approach to Utilized Commercial Semiconductor Devices in Space(T. Ohtani/2000) Proceedings of The 4th International Workshop on Radiation Effects on Semiconductor Devices for Space Application
A Comprehensive SEU Test Method for Microprocessors(R. Tsuzuranuki/1999) RADECS
FPGAの宇宙機器への適用事例( K. Chiba/1999) #7Japanese FPGA/PLD Design Conference & Exhibit
Low Dose-rate Gamma-ray Irradiation on Space Semiconductor Devices(K. Chiba/1998) Proceedings of The 3rd International Workshop on Radiation Effects on Semiconductor Devices for Space Application
SEU Testing of Commercial Semiconductor Deviceson MDS-1(K. Matsuzaki/1998) Proceedings of The 3rd International Workshop on Radiation Effects on Semiconductor Devices for Space Application
民生用DRAMに対する低ドーズ率ガンマ線照射試験(K. Sugimoto/1998) 電子情報通信学会 ソサイエティ大会
Application of Field Programmable Gate Array to Space Projects(K. Chiba/1997) The 3rd ESA Electronic Components Conference (EECC'97)
FPGAの宇宙機器への適用( K. Chiba/1996) 第40回宇宙科学技術連合講演会講演集
FPGAの宇宙機器への適用(K. Chiba/1996) The 4th Japanese FPGA/PLD Design Conference & Exhibit -CONFERENCE 予稿集
Application of Non-radiation Hardened Devices for Space Electronics and Their Evaluation Technique(K. Sugimoto/1996) Proceedings of The 2nd International Workshop on Radiation Effects on Semiconductor Devices for Space Application
Evaluation of Single Event Effects for Power MOSFET and Study of Their Application fro Artificail Satellites( I. Naito/1996) Proceedings of The 2nd International Workshop on Radiation Effects on Semiconductor Devices for Space Application
Actel社製FPGAの宇宙用としての耐放射線性試験について(K. Sugimoto/1995) The 3rd Japanese FPGA/PLD Design Conference & Exhibit 予稿集
アンチフューズ形FPGAの宇宙機器への適用について(K. Sugimoto/1995) (社)電子情報通信学会 信学技報
半導体デバイスの低線量率照射試験技術と宇宙機器への適用について( S. Kuboyama/1995) 放射線と産業
ページ先頭へ戻る